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Optional test platforms for different products
| Tester | Switch | LNA | Splitter | ANT Tuner | Filter | 4G/5G PA |
| LTX PAx AC | √ | √ | √ | √ | √ | √ |
| AMB7600 | √ | √ | √ | √ | √ | √ |
| LTX CX | √ | √ | √ | √ | √ | Χ |
| NI PXI | √ | √ | √ | √ | √ | Χ |
Rich development experience for RF product
- 2 dedicated development engineers focus on RF product
- More than 10 years development experience on RF test.
- Short implement cycle time(<1wk for nomal product)
- Test time reduction: Test item/limit optimization base on test data analyzing, Test method change/wait time reduction
- Major customer: ALP / MXD / RDA
Lost Solution with Ping-Pong mode
- Ping-Pong mode benefit: 30% of test cost saving.
Cost down solution
Tester efficiency
- To develop test solution on QTT / AMI to support Ping-Pong model
- Ping-Pong mode benefit: 30% of test cost saving.
- Major customers: AMZ / LIF / WIS
Test time reduction
- Test item/limit optimization base on data analyzing.
- Test method change/wait time reduction.
- AMZ / LIF / WIS (60ms-> 45ms)
Rich development experience for TVS product
- Hardware design and PCB layout.
- 2 dedicated experienced engineers focus on TVS product development.
- Short implement cycle time(1day for normal product after HW ready)
Key test parameter: Gain, PAE, Harmonic (2nd/3rd), P1dB/IP3, ACPR/EVM
Sub-6GHz 5G PA/FEM test
- Higher frequency (3.3GHz~4.9GHz)
- Higher bandwidth (>200MHz)
- Sub-6GHz 5G RF test solution can be worked out by upgrading our existing tester and handler within 2 months.
mmWave test
- Key test challenges at mmWave
Test Method of mmWave
- Wireless test head needed
- Isolation box needed(upgrading handler)
- New Tester needed(NI-STS)
| Product / Bandwidth | 2G | 3G | 4G | 5G | |
| 800MHz~2GHz | 2GHz~2.2GHz | 1.7G~2.7G | 3.3GHz~5.9GHz | >28GHz (mmWave) | |
| 6MHz~24MHz | 15MHz | 15MHz~130MHz | <160MHz | >400MHz | |
| Switch | √ | √ | √ | √ | Θ |
| Filter (SAW/BAW) | √ | √ | √ | √ | Θ |
| Diplexer / Multiplexer | √ | √ | √ | √ | Θ |
| PA (Power Amplifier) | √ | √ | √ | √ | Θ |
| LNA (Low Noise Amplifier) | √ | √ | √ | √ | Θ |
| Antenna Tuner | √ | √ | √ | √ | Θ |
| SiP (include 2 or more componenets into a package) | √ | √ | √ | √ | Θ |
Θ = Under Development
| Technology Group | Handlers | Tester | Socket / Pin |
| Di-FEM (Filter+Switch) (<6GHz) |
CSZ capable | CSZ capable | CSZ capable |
| LFEM (Switch+LNA) (<6GHz) |
CSZ capable | CSZ capable | CSZ capable |
| PAMiD (PA+Filter) (<6GHz) |
CSZ capable | CSZ capable | CSZ capable |
| Wifi FEM (<7.125GHz) |
CSZ capable | CSZ capable | CSZ capable |
| mm Wave (>7.125GHz) |
Under Roadmap | Under Roadmap | Under Roadmap |
- Higher frequency (3.3GHz~4.9GHz)
- Higher bandwidth(250MHz).
- Sub-6GHz 5G RF test solution
New tester investment (under development）
Pellentesque habitant morbi tristique senectus et netus et malesuada fames ac turpis egestas. Vestibulum tortor quam, feugiat vitae, ultricies eget, tempor sit amet, ante. Aenean ultricies mi vitae est. Mauris placerat eleifend leo. Quisque sit amet est et sapien ullamcorper pharetra. Aenean ultricies mi vitae est. Mauris placerat eleifend leo. Quisque sit amet est et sapien ullamcorper pharetra. Vestibulum erat wisi, condimentum sed, commodo vitae, ornare sit amet, wisi. Aenean fermentum, elit eget tincidunt condimentum, eros ipsum rutrum orci, sagittis tempus lacus enim ac dui. Donec non enim in turpis pulvinar facilisis. Ut felis.
| Tester Type | Tester Model | Vendor | Qty | Origin | Capability |
| Mixed Signal | Eagle-364A | Teradyne | 5 | US | Support 2A max Current,100V max Vlotage, configC can up to 100A |
| Eagle-364B | 28 | US | |||
| Eagle-ETS88 | 10 | US | |||
| ASL1K | Cohu | 36 | US | 45V,2A(Can up to 100A) | |
| STS8200 | AccoTest | 22 | China | 50V,10A | |
| QTT8100 | PowerTech | 1 | China | 120V,10A | |
| STS8300 | AccoTest | 7 | China | 100A Floating VI source | |
| Amida 3001XP | Amida | 15 | China | 1A,45V | |
| RF | LTX PAX | Cohu | 3 | US | PAxAC:2SG for the dual sites,16 RF ports 6GHz source and 8GHz RF measurement, 16dBm max source level, 250MHz measure bandwidth. |
| PXI-NI | NI | 108 | US | ||
| AMB7600 | Aemulus | 23 | Malaysia | Aemulus: with wolfer option, can up to 35dBm source out | |
| Discrete | QT6100 | PowerTech | 23 | China | 600V,3A |
| QT4100B | PowerTech | 12 | China | DC: 1000V,100A; RG:4980A LCR meter& 25V max VDS; DVDS: 10A,200V; UIL: 200A Pulse,2000V& 0.01-59.9mH |
Remark: Soft docking, Short Test Time, Support Ping-pong, High Current (100A)
- n16/32 RF Ports
- n2 VST , Bandwidth 1G hz
- nFequency <6G Hz
- nDigital channel: 32 /128M per channel
- nQuadrant output , fully Kelvin connections
- nMax DC ±10A / 40V
- n4K pattern depth, 16-Bit AWG per channel
- nCan be upgrade 20V/100A
| Type | ||||
| Discrete | 45V 2A *ASL1000 |
DC 2000V 100A RG / CAP *QT4100 |
600V 3A 3CHs *QT6100 |
1200V 30A 6CHs *QT6200 |
| Mix Signal | 45V 2A 14MHz *ASL1000 |
100V 10A 66MHz *Eagle 364 |
50V 10A 100M *STS8200 |
100V 100A 100M *ST8300 |
| RF | *LTX CX | Frequency: <5.9G 90MHz *AMB7600 |
Frequency: <6G 1GHz *STS T4 PGT NI |
Frequency: >28G (5G) *NI STS |
QT4100
QT6100
STS8200
STS8300
Eagle364
AMB7600
STS T4
PGT NI
| Handle Type | Handler Model | Vendor | Qty | PKG size | Origin | Capability |
| Turret | SRM XD248 | SRM | 47 | MLP >= 2×2 | Malaysia | Thickness > 0.4 Room Temp |
| SRM Z208 | 110 | MLP >= 1.0×0.6 | Malaysia | Thickness > 0.25 Room Temp | ||
| SRM Z208T | 7 | MLP >= 1×1 | Malaysia | Thickness > 0.25 Room Temp | ||
| SRM XD208 | 3 | MLP >= 2×3 | Malaysia | Thickness > 0.6 Room Temp | ||
| SRM Z206 | 3 | MLP >= 1×1 | Malaysia | Thickness > 0.4 Room Temp Support Laser funtion |
||
| ISM NX16 | Cohu | 7 | X3 (0.3×0.6) | US | Room Temp | |
| ASM FT-Mini | ASM | 20 | 0.6*0.3 | China | Small package size | |
| Tesec 4170 | TESEC | 11 | MLP >= 1×1 | Japan | Package size 1×1 – 3×3 Up to 64 site |
|
| Strip Test | DPE K8 | MI Equipment | 8 | Malaysia | 12 inches capable | |
| Hontech 7045 | Hontech | 13 | MLP >= 3×3 | China | Room and Hot Temp | |
| Pick & Place | ADV 4841 | ADV | 12 | Japan | Tri-temp Up to 8 sites | |
| JHT Exceed-8008 | JHT | 22 | China |
Remark: High Speedup(up to 50k UPH), Ambient test, T&R Integrated, Mini Package Prefer (<3*3mm), Mini Package Thickness 0.3mm
Remark: Hard docking, Ambient/Hot/Cold Test, Bake after test
- nSRM Z208, ISM NX16, ASM FT-MINI
- nPackage 0.6*0.3mm (T: 0.3mm)
- n5 sides Vision Inspection
- nMTBA > 60 mins
- nMax UPH 50k
- nHT7045, HT1026, JHT Exceed-8008
- nTri temp(-55~130 ºC ±2 ºC )
- nMax UPH 13k
- n16 sites max
| Type | ||||
| Turret | >2mm*2mm T>0.45mm *SRM XD248 *SRM F208 |
>0.6mm*0.3mm T>0.3mm *A SM FT-mini *Ismeca NX16 |
>0.6mm*0.3mm T>0.3mm *SRM Z208 (High UPH) |
>0.4mm*0.2mm T>0.25mm *Ueno SeiKi |
| Pick & Place | Room Temp >3*3mm *Hontech9040 |
Room Temp~120°c >3*3mm *JHT 6000H |
Room Temp~130°c >3*3mm *JHT 8008H |
Tri-Temp (-55~150°c) >3*3mm *Hontech 1026 |
| Scrip Test | >1*1mm up to 64 sites *Tesec 4170 |
>0.6mm*0.3mm *Mi DPE K8 |
>0.4*0.2mm *MIE Mi30 |
|
SRM XD248
ASM FT-Mini
SRM Z208
HT7045
JHT8008
TESEC 4170-IH