Pellentesque habitant morbi tristique senectus et netus et malesuada fames ac turpis egestas. Vestibulum tortor quam, feugiat vitae, ultricies eget, tempor sit amet, ante. Aenean ultricies mi vitae est. Mauris placerat eleifend leo. Quisque sit amet est et sapien ullamcorper pharetra. Aenean ultricies mi vitae est. Mauris placerat eleifend leo. Quisque sit amet est et sapien ullamcorper pharetra. Vestibulum erat wisi, condimentum sed, commodo vitae, ornare sit amet, wisi. Aenean fermentum, elit eget tincidunt condimentum, eros ipsum rutrum orci, sagittis tempus lacus enim ac dui. Donec non enim in turpis pulvinar facilisis. Ut felis.
Optional test platforms for different products
Tester | Switch | LNA | Splitter | ANT Tuner | Filter | 4G/5G PA |
LTX PAx AC | √ | √ | √ | √ | √ | √ |
AMB7600 | √ | √ | √ | √ | √ | √ |
LTX CX | √ | √ | √ | √ | √ | Χ |
NI PXI | √ | √ | √ | √ | √ | Χ |
Lost Solution with Ping-Pong mode
- Ping-Pong mode benefit: 30% of test cost saving.
Rich development experience for RF product
- 2 dedicated development engineers focus on RF product
- More than 10 years development experience on RF test.
- Short implement cycle time(<1wk for nomal product)
- Test time reduction: Test item/limit optimization base on test data analyzing, Test method change/wait time reduction
- Major customer: ALP / MXD / RDA
Rich development experience for TVS product
- Hardware design and PCB layout.
- 2 dedicated experienced engineers focus on TVS product development.
- Short implement cycle time(1day for normal product after HW ready)
Cost down solution
Tester efficiency
- To develop test solution on QTT / AMI to support Ping-Pong model
- Ping-Pong mode benefit: 30% of test cost saving.
- Major customers: AMZ / LIF / WIS
Test time reduction
- Test item/limit optimization base on data analyzing.
- Test method change/wait time reduction.
- AMZ / LIF / WIS (60ms-> 45ms)
Sub-6GHz 5G PA/FEM test
- Higher frequency (3.3GHz~4.9GHz)
- Higher bandwidth (>200MHz)
- Sub-6GHz 5G RF test solution can be worked out by upgrading our existing tester and handler within 2 months.
mmWave test
- Key test challenges at mmWave
Test Method of mmWave
- Wireless test head needed
- Isolation box needed(upgrading handler)
- New Tester needed(NI-STS)
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Tester Type | Tester Model | Vendor | Qty | Capability |
Mixed Signal | Eagle-364A | Teradyne | 5 | 1. APU12/DPU16/SPU100/HPU |
Eagle-364B | 6 | |||
Eagle-364c | 1 | |||
ASL1K | LTX-Credence | 36 | 1. OVI/DVI300/DVI-2K | |
STS8200 | AccoTest | 2 | ||
Amida 3001XP | Amida | 15 | 1. Analog / Digital support 2. TVS Tester |
|
RF | LTX CX | LTX-Credence | 3 | 1. Support RF Switch/LNA/PA/FEM 2. Max power 37dBm (AMB7600) 3. Harmonic testing supporting |
LTX PAx AC | LTX-Credenc | 1 | ||
AMB7600 | Aemulus | 23 | ||
Discrete | QT6133SC | PowerTech | 13 | 1. Faster TVS Tester (w/ capacitor) |
QT4100B | PowerTech | 3 | 1. Power MOSFET (up to 100A) | |
QT8100 | PowerTech | 1 | 1. Digital / MixSignal |
Handle Type | Handler Model | Vendor | Qty | PKG size | Capability |
Turret | SRM xD248 | SRM | 58 | MLP >=2×2 | 1. Room Temp 2. Small package size 3. 5 sides vision inspection |
SRM F208 | 17 | MLP<2×2 | |||
SRM Z208 | 71 | ||||
ISM NX16 | Cohu | 11 | X3 (0.3X0.6) 1.0×0.6 |
1. Room Temp 2. Small package size |
|
ASM FT-Mini | ASM | 20 | |||
Strip Test | Tesec 4170 | TESEC | 11 | MLP>=1×1 | 1. Package size 1×1 – 3×3 2. Up to 64 site 3. 12 inches capable |
DPE K8 | MI Equipment | 8 | |||
Pick&Place | Hontech 7045 | Hontech | 13 | MLP>=3×3 | 1. Room and Hot Temp 2. Up to 8 site |
JHT CRAB-6000H-R | JHT | 1 | |||
JHT Exceed-8008 | JHT | 5 |